Instrument: Mass Spectrometer

Dataset: 
Thaps_57Fe_distribution
Instrument: 
Mass Spectrometer
Instrument Short Name: Mass Spec
Community Standard Description
(http://vocab.nerc.ac.uk/collection/L05/current/LAB16/)
Instrument Description:

General term for instruments used to measure the mass-to-charge ratio of ions; generally used to find the composition of a sample by generating a mass spectrum representing the masses of sample components.

PI supplied instrument name: NanoSIMS mass spectrometry
Dataset-specific description

Three cells of T. pseudonana were analyzed for relative elemental contents at nanometer scale resolution using Nanoscale Secondary Ion Mass Spectrometry (NanoSIMS). Secondary Ion Mass Spectrometry (SIMS) is a surface analysis technique that provides information about the lateral distribution of any element and its isotopes, and quantitative information about the isotopic composition of a sample. NanoSIMS allows for elemental and isotopic analysis down to the 50-nanomenter scale.