Instrument: Scanning Electron Microscope

Instrument Short Name: SEM
Instrument Description:

A scanning electron microscope (SEM) scans a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.

PI supplied instrument name: Zeiss Supra25 field emission scanning microscope
Dataset-specific description

Zeiss Supra25 field emission scanning microscope