Status message

View this page on the new BCO-DMO website: https://demo.bco-dmo.org/instrument/637895

Instrument: Scanning Electron Microscope

Acronym:
 SEM
External Identifier:
» skos:broadMatch http://vocab.nerc.ac.uk/collection/L05/current/LAB07/
Description

A scanning electron microscope (SEM) scans a focused electron beam over a surface to create an image. The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.